High-Fidelity Quantum Logic Gates Using Trapped-Ion Hyperfine Qubits

TitleHigh-Fidelity Quantum Logic Gates Using Trapped-Ion Hyperfine Qubits
Publication TypeJournal Article
Year of Publication2016
AuthorsBallance, CJ, Harty, TP, Linke, NM, Sepiol, MA, Lucas, DM
JournalPhys. Rev. Lett.
Volume117
Pagination060504
Date PublishedAug
URLhttp://link.aps.org/doi/10.1103/PhysRevLett.117.060504
DOI10.1103/PhysRevLett.117.060504